Investigating the Optical Properties of Dislocations by Scanning Transmission Electron Microscopy

microscope (STEM) allows collection of a number of simultaneous signals, such as cathodolumines-cence (CL), transmitted electron intensity and spectroscopic information from individual localized defects. This review traces the development of CL and atomic resolution imaging from their early in-ception through to the possibilities that exist today for achieving a true atomic-scale understanding of the optical properties of individual dislocations cores. This review is dedicated to Professor David Holt, a pioneer in this field. SCANNING 30