This paper considers the case of Constant-Stress Partially Accelerated Life Testing (CSPALT) when two stress levels are involved under type-I censoring. The lifetimes of test items are assumed to follow a two-parameter Pareto lifetime distribution. Maximum Likelihood (ML) method is used to estimate the parameters of CSPALT model. Confidence intervals for the model parameters are constructed. Optimum CSPALT plans, that determine the best choice of the proportion of test units allocated to each stress, are developed. Such optimum test plans minimize the Generalized Asymptotic Variance (GAV) of the ML estimators of the model parameters. For illustration, numerical examples are presented. 1
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
The problem of testing the product units under stress higher than normal stress conditions is widely...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-II ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
In this paper, the point at issue of this paper is to deliberate point and interval estimations for ...
Modern reliability engineering accelerated life tests (ALT) and partially accelerated life tests (PA...
In order to quantify the life characteristics of a product, partially accelerated life tests are use...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
The problem of testing the product units under stress higher than normal stress conditions is widely...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-II ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
In this paper, the point at issue of this paper is to deliberate point and interval estimations for ...
Modern reliability engineering accelerated life tests (ALT) and partially accelerated life tests (PA...
In order to quantify the life characteristics of a product, partially accelerated life tests are use...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
The problem of testing the product units under stress higher than normal stress conditions is widely...