Abstract—Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip (SoC) implementations. The case studies include embedded hard core and soft core processors which manipulate configuration memory bits to emulate physical and transient faults in the FPGA core in-cluding shorts and opens in programmable interconnect and many different faults in logic resources. The emulated faults are used to evaluate fault detection capabilities of Built-In Self-Test (BIST) approaches, including fault identi-fication capabilities of diagnostic procedures, and to evalu-ate the effect of Single Event Upsets (SEUs), including their detecti...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
Embedded processor cores, which are widely used in SRAM-based FPGA applications, are candidates for ...
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to l...
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital...
Abstract – We present an embedded processor based approach for Built-In Self-Test (BIST) and diagnos...
International audienceThis paper describes two different but complementary approaches that can be us...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
The paper presents the extent of fault effects in FPGA based systems and concentrates on transient f...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
Abstract: Microprocessor-based embedded systems are increasingly used to control safetycritical syst...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
Embedded processor cores, which are widely used in SRAM-based FPGA applications, are candidates for ...
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to l...
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital...
Abstract – We present an embedded processor based approach for Built-In Self-Test (BIST) and diagnos...
International audienceThis paper describes two different but complementary approaches that can be us...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
The paper presents the extent of fault effects in FPGA based systems and concentrates on transient f...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
Abstract: Microprocessor-based embedded systems are increasingly used to control safetycritical syst...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
Embedded processor cores, which are widely used in SRAM-based FPGA applications, are candidates for ...
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to l...