Quantum Cellular Automata: New Defects and Faults for New Devices

There has been considerable research on quantum cel-lular automata (QCA) as a new computing scheme in the nano-scale regimes. In this paper, a detailed simulation-based characterization of defects in different QCA logic and interconnect devices and study of their effects at logic-level are presented. Various failure mechanisms which can po-tentially happen during nano-manufacturing of these de-vices have been considered and simulated. Different im-plementations of QCA logic devices and interconnects are also compared in term of defect tolerance and testability. The same study is performed for new proposed QCA de-vices too. The simulation results show that additional fault models at logic level must be considered for testing of QCA-based circuits.