ELEKTRONIKA Embedded Method of Soc Memory Repairing

The memory diagnosis and repair problem [1-12] is related to the tendency of continuous reduction of chip area, which is allocated to original and standardized logic, and simultaneous growth of embedded memory. As it is represented in Fig. 1, increase of the memory specific weight on a chip reduces to its complete dominance for data and program storage, which will reach 94 % by the year 2014 [2]. It will provide not only fast response of carrying out of functions, but also flexibility that is appropriate to software concerning design error correction. The memory element feature is the fact that some cells can fail under fault influence in the process of production and operation. This fact not always brings a memory matrix into a critical state, when the repair is not possible. So, such technical memory state, when the total quantity of faulty cells is not greater than spare capacities of a device (intended for repair), is considered below. The research aim is to develop an algebra-logical method of embedded matrix memory diagnosis and repair in real time