In this article, the failure rates of the system's components are functions of time t. We study two cases (i) the life time distribution of a components has two stages with increasing failure rates, (ii) the failure rates of the components have the two stages. The reliability equivalence factors of some systems with identical components are obtained. Two different methods are used to improve the given systems. Numerical examples are presented to interpret how one can utilize the obtained results. Some special cases are obtained from our results. KEY WORDS Linear increasing failure rate distribution; rayleigh distribution; exponential distribution; mixture distributions; mixture failure rates; hot duplication; reduction method; reliabil...
AbstractThis paper deals with the reliability function and the failure rate of the k out of n system...
It is quite plausible that any device or system reliability shows an increasing failure rate (IFR) a...
Comparisons between the failure rate of a new unit with that of the residual life of a used unit are...
Recently, [1,2] generalized the reliability equivalence technique to a system with mixed of two non-...
AbstractRecently, [1,2] generalized the reliability equivalence technique to a system with mixed of ...
We study reliability equivalence factors of a system of independent and identical components with ex...
The reliability equivalence factors of a parallel system with n independent and identical components...
In this study, we discuss the reliability equivalence factors of a series-parallel system with n ser...
In this study, mixture reliability functions, mixture probability density functions and mixture haz...
This thesis investigates methods for assessing reliability equivalence factors for several common sy...
The paper discusses some common reliability architectures, such as "parallel" and "k-out-of-n" syste...
In this paper we study equivalence of different designs of a four independent and identical componen...
In reliability, a life time distribution can be characterized by the reliability function, hazard ra...
Abstract This paper extends the concept of reliability equivalence from simple series and parallel s...
Abstract. This paper gives the reliability equivalence factors of a parallel system with n independe...
AbstractThis paper deals with the reliability function and the failure rate of the k out of n system...
It is quite plausible that any device or system reliability shows an increasing failure rate (IFR) a...
Comparisons between the failure rate of a new unit with that of the residual life of a used unit are...
Recently, [1,2] generalized the reliability equivalence technique to a system with mixed of two non-...
AbstractRecently, [1,2] generalized the reliability equivalence technique to a system with mixed of ...
We study reliability equivalence factors of a system of independent and identical components with ex...
The reliability equivalence factors of a parallel system with n independent and identical components...
In this study, we discuss the reliability equivalence factors of a series-parallel system with n ser...
In this study, mixture reliability functions, mixture probability density functions and mixture haz...
This thesis investigates methods for assessing reliability equivalence factors for several common sy...
The paper discusses some common reliability architectures, such as "parallel" and "k-out-of-n" syste...
In this paper we study equivalence of different designs of a four independent and identical componen...
In reliability, a life time distribution can be characterized by the reliability function, hazard ra...
Abstract This paper extends the concept of reliability equivalence from simple series and parallel s...
Abstract. This paper gives the reliability equivalence factors of a parallel system with n independe...
AbstractThis paper deals with the reliability function and the failure rate of the k out of n system...
It is quite plausible that any device or system reliability shows an increasing failure rate (IFR) a...
Comparisons between the failure rate of a new unit with that of the residual life of a used unit are...