A standard cell library was developed using a commercial 0.24 µm, 2.5 V CMOS technology. Radiation tolerant design techniques have been employed on the layout of the cells to achieve the total dose hardness levels required by LHC experiments. The library consists of digital core cell elements as well as a number of I/O pad cells. Additionally, it includes a pair of differential driver and receiver pads implementing the LVDS standard. The library cells have been fully characterised and the necessary descriptions to facilitate simulation have also been generated. The presented library features 5 times increase in speed accompanied by 26 times reduction in power consumption as well as an increase of 8 times in gate densities when compared to a...
This thesis discusse s th e issues r elated to the us e of enclosed-gate layou t trans isto rs and ...
none1noThis work summarizes the status of the art of electronic designs, using CMOS technologies, to...
The radiation tolerance of 65 nm bulk CMOS devices was investigated using 10 keV X-rays up to a Tota...
%title\\ \\In the recent years, intensive work has been carried out on the development of custom ICs...
The harsh radiation environment at the Large Hadron Collider (LHC) requires radiation hard ASICs. Th...
Radiation effects which may degrade integrated circuit performance significantly make it challengeab...
The increase of luminosity foreseen for the future upgrades of the Large Hadron Collider at CERN wil...
The radiation environment present in some of today's High-Energy Physics (HEP) experiments and in sp...
We discuss design issues related to the extensive use of Enclosed Layout Transistors (ELT's) and gua...
The paper shows the radiation effects on 65 nm standard CMOS technology and RHBD (Radiation Har...
This paper proposes a design methodology for a digital library of cells resistant to cosmic radiatio...
Abstract In this paper, we present a new radiation tolerant CMOS standard cell library, and demonst...
This talk will review progress and status of testing of deep submicron CMOS technology for tolerance...
Total dose & neutron tests on commercial CMOS digital-to-analog converters have been carried out. Th...
130 nm and 90 nm CMOS processes are going to be used in the design of mixed-signal integrated circui...
This thesis discusse s th e issues r elated to the us e of enclosed-gate layou t trans isto rs and ...
none1noThis work summarizes the status of the art of electronic designs, using CMOS technologies, to...
The radiation tolerance of 65 nm bulk CMOS devices was investigated using 10 keV X-rays up to a Tota...
%title\\ \\In the recent years, intensive work has been carried out on the development of custom ICs...
The harsh radiation environment at the Large Hadron Collider (LHC) requires radiation hard ASICs. Th...
Radiation effects which may degrade integrated circuit performance significantly make it challengeab...
The increase of luminosity foreseen for the future upgrades of the Large Hadron Collider at CERN wil...
The radiation environment present in some of today's High-Energy Physics (HEP) experiments and in sp...
We discuss design issues related to the extensive use of Enclosed Layout Transistors (ELT's) and gua...
The paper shows the radiation effects on 65 nm standard CMOS technology and RHBD (Radiation Har...
This paper proposes a design methodology for a digital library of cells resistant to cosmic radiatio...
Abstract In this paper, we present a new radiation tolerant CMOS standard cell library, and demonst...
This talk will review progress and status of testing of deep submicron CMOS technology for tolerance...
Total dose & neutron tests on commercial CMOS digital-to-analog converters have been carried out. Th...
130 nm and 90 nm CMOS processes are going to be used in the design of mixed-signal integrated circui...
This thesis discusse s th e issues r elated to the us e of enclosed-gate layou t trans isto rs and ...
none1noThis work summarizes the status of the art of electronic designs, using CMOS technologies, to...
The radiation tolerance of 65 nm bulk CMOS devices was investigated using 10 keV X-rays up to a Tota...