www.elsevier.com/locate/planspasci TOF-SIMS in cosmochemistry

Time-of-.ight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement—both polarities in subsequent analyses, (b) high lateral resolution, (c) su4cient mass resolution for separation of major mass interferences, and (d) little sample destruction. This combination makes TOF-SIMS highly suitable for the analysis especially of small samples, like interplanetary and presolar dust grains, as well as tiny inclusions within meteorites. Limitations of this technique are mainly referring to isotopic measurements and quanti7cation. The possibility to measure molecular and atomic ion species simultaneously extends the applications of TOF-SIMS to the investigation of indigenous hydrocarbons in extraterrestrial material, which might have bee