Single Event Transient Characterization in the LM119 Voltage Comparator

SETs generated by pulsed-laser light, heavy ions and circuit simulators in the LM119 fast voltage comparator are compared under various operating conditions. The use of the pulsed laser for hardness assurance is also described. There is currently great interest in studying single event transients (SETs) in linear bipolar circuits. [1,2,3,4,5,6,8,11] This is motivated by the desire to limit the number of operating condition