Theory and Measuring of Antireflection Coatings

The characterization of antireflection (AR) coatings is not trivial. A preferred measure-ment method is the Hakki-Paoli method. But for broad-area lasers, an advanced method has to be used. One way is the measurement of the spectrally resolved far field, another is the use of single-mode ridge-waveguide lasers. Different AR coatings in the range of 10−1–10−4 (fabricated by ion-beam sputter deposition) have been deposited on single-mode lasers and characterized successfully. 1