Abstract: This paper presents a method to diagnose faults in FPGA interconnection resources. A single fault model is given. Under the given model, a diagnosing method is proposed. At most five programming steps in the proposed method is required if adaptive testing scheme is used. For non-adaptive test, eight programming steps is re-quired to diagnose all the possible faults under the given single fault model. The accuracy of the fault diagnosing is one segment for a segment stuck-at or stuck-open fault, a segment pair for a bridge fault, a switch for switch stuck-on or stuck-off fault
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
The SRAM cells that form the configuration memory of an SRAM-based FPGA make such FPGAs particularly...
[[abstract]]A new built-in self-test (BIST)-based diagnosis scheme for field programmable gate array...
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period i...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleru...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strateg...
The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable ma...
Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) b...
We shall present a simple but useful method which detects all multiple stuck-at faults in the applic...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolera...
Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) b...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
The SRAM cells that form the configuration memory of an SRAM-based FPGA make such FPGAs particularly...
[[abstract]]A new built-in self-test (BIST)-based diagnosis scheme for field programmable gate array...
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period i...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleru...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strateg...
The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable ma...
Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) b...
We shall present a simple but useful method which detects all multiple stuck-at faults in the applic...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolera...
Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) b...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery p...
The SRAM cells that form the configuration memory of an SRAM-based FPGA make such FPGAs particularly...
[[abstract]]A new built-in self-test (BIST)-based diagnosis scheme for field programmable gate array...