Abstract In this paper, the natures of random and pseudo-random input sequences and their influence on permanent and intermittent fault detecting are analyzed. The aliasing fault coverage between the pseudo-random and random sequences is estimated. The activity probability features of the intermittent faults are considered. The self-test circuits of the intermittent faults are illustrated. The experimental results based on real circuits are obtained through simulation. The mathematical analysis and experimental results show that the quality of the pseudo-random testing is better than that of the random testing for the permanent and intermittent faults. The Markov chain models are used in obtaining the input sequence length needed for determ...
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
The statistical properties of a pseudorandom sequence being characterized by the distribution of the...
For non-real time multimedia systems, we present a fuzzy approach to replacing the faulty module. Af...
In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-ra...
A lisfruct-The problem of detecting permanent faults in sequential circuits by random testing is ana...
The increasing complexity of today's digital devices has rendered the problem of fault detection, fa...
Abstract-A continuous-parameter Markov model for intermit-tent faults in digital systems is presente...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
International audienceThe combination of higher quality requirements and sensitivity of high perform...
[[abstract]]Pseudorandom testing has been widely used in built-in self-testing of VLSI circuits. Alt...
The article systematizes the basic scientific principles about statistical testing of random and pse...
The test pattern generator produces test vectors that are applied to the tested circuit during pseu...
In this paper the problem of unsatisfactory diagnostic efficiency of pseudorandom testing (PRT) tech...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
The number of (random) patterns required for random testing of RAMs (random-access memories), when c...
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
The statistical properties of a pseudorandom sequence being characterized by the distribution of the...
For non-real time multimedia systems, we present a fuzzy approach to replacing the faulty module. Af...
In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-ra...
A lisfruct-The problem of detecting permanent faults in sequential circuits by random testing is ana...
The increasing complexity of today's digital devices has rendered the problem of fault detection, fa...
Abstract-A continuous-parameter Markov model for intermit-tent faults in digital systems is presente...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
International audienceThe combination of higher quality requirements and sensitivity of high perform...
[[abstract]]Pseudorandom testing has been widely used in built-in self-testing of VLSI circuits. Alt...
The article systematizes the basic scientific principles about statistical testing of random and pse...
The test pattern generator produces test vectors that are applied to the tested circuit during pseu...
In this paper the problem of unsatisfactory diagnostic efficiency of pseudorandom testing (PRT) tech...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
The number of (random) patterns required for random testing of RAMs (random-access memories), when c...
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
The statistical properties of a pseudorandom sequence being characterized by the distribution of the...
For non-real time multimedia systems, we present a fuzzy approach to replacing the faulty module. Af...