Information integrity in cache memories is a fundamen-tal requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it difficult to trade between the level of data in-tegrity and the chip area requirement. We focus on transient fault tolerance in primary cache memories and develop new architectural solutions to maximize fault coverage when the budgeted silicon area is not sufficient for the conventional configuration of an error checking code. The underlying idea is to exploit the corollary of reference locality in the organization and management of the code. A higher protec-tion priority is dynamically assigned to the portions of the cache that are more error-prone and have a hi...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
thorough reading and helpful comments. Authors also acknowledge Allen Sansano’s contribution in sett...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Information integrity in cache memories is a fundamen-tal requirement for dependable computing. Conv...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conve...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
thorough reading and helpful comments. Authors also acknowledge Allen Sansano’s contribution in sett...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Information integrity in cache memories is a fundamen-tal requirement for dependable computing. Conv...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conve...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
thorough reading and helpful comments. Authors also acknowledge Allen Sansano’s contribution in sett...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...