Add to ORKGAb8t~ac t- In this paper, we propose a new built-in self-diagnosis (BISD) method to simultoneoualy diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial in-terfacing technique is proposed to deal with such an issue. B y tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolemble diagnostic time, and high diagnostic coverage
[[abstract]]© 2002 Institute of Electrical and Electronics Engineers - The authors present test algo...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
A Memory Debug Technique plays a key role in System-on-chip (SOC) product development and yield ramp...
[[abstract]]We present a memory built-in self-diagnosis (BISD) design that incorporates a fault synd...
[[abstract]]Hundreds of memory cores can be found on a typical system-on-chip (SOC) today. Diagnosin...
[[abstract]]The objective of this paper is to present a cost-effective fault diagnosis methodology f...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-B...
. This paper presents a new scan-based BIST scheme which achieves very high fault coverage without t...
Traditional tests for memories are based on conventional fault models, involving the address decoder...
We present a new scan built-in self-test (BIST) approach for determining failing vectors for fault d...
Process scaling has given designers billions of transistors to work with. As feature sizes near the ...
The current system-on-chip (SoC)-based devices uses embedded memories of enormous size. Most of thes...
[[abstract]]© 2002 Institute of Electrical and Electronics Engineers - The authors present test algo...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
A Memory Debug Technique plays a key role in System-on-chip (SOC) product development and yield ramp...
[[abstract]]We present a memory built-in self-diagnosis (BISD) design that incorporates a fault synd...
[[abstract]]Hundreds of memory cores can be found on a typical system-on-chip (SOC) today. Diagnosin...
[[abstract]]The objective of this paper is to present a cost-effective fault diagnosis methodology f...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-B...
. This paper presents a new scan-based BIST scheme which achieves very high fault coverage without t...
Traditional tests for memories are based on conventional fault models, involving the address decoder...
We present a new scan built-in self-test (BIST) approach for determining failing vectors for fault d...
Process scaling has given designers billions of transistors to work with. As feature sizes near the ...
The current system-on-chip (SoC)-based devices uses embedded memories of enormous size. Most of thes...
[[abstract]]© 2002 Institute of Electrical and Electronics Engineers - The authors present test algo...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
A Memory Debug Technique plays a key role in System-on-chip (SOC) product development and yield ramp...