In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As the IG model rep-resents all information on the implemented logic function as well as the topology of a circuit, the proposed techniques inherit all advan-tages of both general SAT based and structure based approaches to justification, propagation, and implication. These three fundamen-tal Boolean problems are the main tasks to be performed during Automatic Test Pattern Generation (ATPG) such that the proposed algorithms are incorporated into our ATPG tool TIP which is built on top of the implication engine. Working exclusively in the IG, the complex functional ope...
Due to the increased speed in modern designs, testing for delay faults has become an important issue...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...
This paper introduces new methods for fast IG based justification and propagation that are included ...
Automatic Test Pattern Generation (ATPG) is an important task to ensure that a chip functions correc...
This paper presents a flexible and efficient approach to evaluat-ing implications as well as derivin...
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel tech...
Abstract—It is well-known that in principle automatic test pattern generation (ATPG) can be solved b...
This paper presents a flexible and efficient approach to deriving indirect implications in logic cir...
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability o...
[[abstract]]Automatic test pattern generation (ATPG) for path delay faults is an essential tool for ...
Abstract: It is a novel technique for automatic test pattern generation which well detects both easy...
Abstract—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been sho...
AbstractNowadays SAT algorithms allow larger problem instances to be solved in application domains s...
Abstract—SAT-based ATPG turned out to be a robust alter-native to classical structural ATPG algorith...
Due to the increased speed in modern designs, testing for delay faults has become an important issue...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...
This paper introduces new methods for fast IG based justification and propagation that are included ...
Automatic Test Pattern Generation (ATPG) is an important task to ensure that a chip functions correc...
This paper presents a flexible and efficient approach to evaluat-ing implications as well as derivin...
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel tech...
Abstract—It is well-known that in principle automatic test pattern generation (ATPG) can be solved b...
This paper presents a flexible and efficient approach to deriving indirect implications in logic cir...
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability o...
[[abstract]]Automatic test pattern generation (ATPG) for path delay faults is an essential tool for ...
Abstract: It is a novel technique for automatic test pattern generation which well detects both easy...
Abstract—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been sho...
AbstractNowadays SAT algorithms allow larger problem instances to be solved in application domains s...
Abstract—SAT-based ATPG turned out to be a robust alter-native to classical structural ATPG algorith...
Due to the increased speed in modern designs, testing for delay faults has become an important issue...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...
We propose a new method for SAT-based Boolean reasoning on multiple defects in digital ICs. Although...