Abstract. This paper addresses current issues in compact MOSFET modeling, provides an overview and some essential details of SP (a new compact MOSFET model developed at Penn State), and presents original results concerning new applications of the symmetric linearization method and streamlined surface potential (φs) approximation. Introduction. The familiar requirements for compact MOSFET modeling derive from reductions of the device dimensions and power supply voltage. Consequently, there is a need for the accurate description of the moderate inversion region (which expands as a fraction of the overal
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...
Abstract — This paper reports recent progress on partially depleted (PD) SOI modeling using a surfac...
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...
Abstract—This work describes an advanced physics-based com-pact MOSFET model (SP). Both the quasista...
a b s t r a c t Symmetric linearization method is developed in a form free of the charge-sheet appro...
A unified continuous and discrete compact model covering all device operating regions for double-gat...
vania ed fo ne 18 as a l is i surface-potential-based compact MOSFET models. In the previous work su...
This paper reviews present compact model development and outlines the main features of the PUNISM, a...
This paper outlines the advanced Surface-Potential-Plus (SPP) approach for the next generation CMOS ...
This paper reviews present compact model development and outlines the main features of the PUNISM, a...
The importance of obtaining a compact analytical MOSFET model with physical model parameters is incr...
With the continuous scaling of CMOS technologies, Silicon-on-Insulator (SOI) technologies have becom...
Like other surface-potential based model, our surface-potential-plus model starts with charge-sheet ...
An analytic MOSFET surface potential model with inclusion of the poly-gate accumulation, depletion, ...
An analytic MOSFET surface potential model with inclusion of the poly-gate accumulation, depletion, ...
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...
Abstract — This paper reports recent progress on partially depleted (PD) SOI modeling using a surfac...
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...
Abstract—This work describes an advanced physics-based com-pact MOSFET model (SP). Both the quasista...
a b s t r a c t Symmetric linearization method is developed in a form free of the charge-sheet appro...
A unified continuous and discrete compact model covering all device operating regions for double-gat...
vania ed fo ne 18 as a l is i surface-potential-based compact MOSFET models. In the previous work su...
This paper reviews present compact model development and outlines the main features of the PUNISM, a...
This paper outlines the advanced Surface-Potential-Plus (SPP) approach for the next generation CMOS ...
This paper reviews present compact model development and outlines the main features of the PUNISM, a...
The importance of obtaining a compact analytical MOSFET model with physical model parameters is incr...
With the continuous scaling of CMOS technologies, Silicon-on-Insulator (SOI) technologies have becom...
Like other surface-potential based model, our surface-potential-plus model starts with charge-sheet ...
An analytic MOSFET surface potential model with inclusion of the poly-gate accumulation, depletion, ...
An analytic MOSFET surface potential model with inclusion of the poly-gate accumulation, depletion, ...
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...
Abstract — This paper reports recent progress on partially depleted (PD) SOI modeling using a surfac...
An explicit surface potential model of the bulk-MOSFET with inclusion of the poly-gate accumulation,...