particles are released from the surface due to a cas- the formation of which still represents an intrigu-ing phenomenon in sputtering physics [1]. So far, most experimental studies of sputtered clusters have been performed under bombardment with monoatomic – mostly rare gas – ions (cf. [1,2]). reserved
This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardmen...
The main goal of the present study is the investigation of the sputtering of neutral particles from ...
This work focuses on the emission processes of metal-organic clusters MmMen, (M is the organic molec...
Abstract. Mass spectroscopic studies of the neutral particles puttered by Ar + ions at 8 keV from po...
We describe a new tandem mass spectrometer which has been designed to investigate sputtering phenome...
AbstractIn secondary ion mass spectrometry, the detection of MCs+ clusters (with M an element of the...
The intensity and the energy distribution of Si+ n cluster ions emitted from clean silicon have been...
Previous studies have shown that the size distributions of small clusters ( n≤40; n = number of atom...
We have investigated the formation of neutral clusters during self-sputtering of a silver surface un...
Exit-angle resolved Mo atom sputtering yield under Xe ion bombardment and carbon atom and cluster (C...
Previous studies have shown that the size distributions of small clusters ( n<=40 n = number of ...
A combination of imaging techniques (XY) and time-of-flight (TOF) spectroscopy was used to...
We present the results of simulations of cluster formation during Ar^+ → In-Ga (liquid) sputtering e...
This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardmen...
Recent progress in organic secondary ion mass spectrometry (SIMS) relied essentially on the developm...
This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardmen...
The main goal of the present study is the investigation of the sputtering of neutral particles from ...
This work focuses on the emission processes of metal-organic clusters MmMen, (M is the organic molec...
Abstract. Mass spectroscopic studies of the neutral particles puttered by Ar + ions at 8 keV from po...
We describe a new tandem mass spectrometer which has been designed to investigate sputtering phenome...
AbstractIn secondary ion mass spectrometry, the detection of MCs+ clusters (with M an element of the...
The intensity and the energy distribution of Si+ n cluster ions emitted from clean silicon have been...
Previous studies have shown that the size distributions of small clusters ( n≤40; n = number of atom...
We have investigated the formation of neutral clusters during self-sputtering of a silver surface un...
Exit-angle resolved Mo atom sputtering yield under Xe ion bombardment and carbon atom and cluster (C...
Previous studies have shown that the size distributions of small clusters ( n<=40 n = number of ...
A combination of imaging techniques (XY) and time-of-flight (TOF) spectroscopy was used to...
We present the results of simulations of cluster formation during Ar^+ → In-Ga (liquid) sputtering e...
This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardmen...
Recent progress in organic secondary ion mass spectrometry (SIMS) relied essentially on the developm...
This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardmen...
The main goal of the present study is the investigation of the sputtering of neutral particles from ...
This work focuses on the emission processes of metal-organic clusters MmMen, (M is the organic molec...