Add to ORKGPower and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to the circuit reliability. Moreover, it may be responsible for cost, performance verification as well as technology related problems and can dramatically shorten the battery life when on-line testing is considered. In this paper, we present a survey of the low power testing techniques that can be used to test VLSI systems. In the first part, the paper explains the problems induced by the increased power consumed during functional testing of a circuit, in either external testing or built-in self-test (BIST). Next, we survey state-of-the-art techniques that exist to re...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN040606 / BLDSC - British Library D...
Power minimization and test length reduction are two objectives for BIST (Built-In-Self-Test). To re...
circuit were proposed. It eliminates the peak power consumption problem of conventional shift-based ...
Low-power VLSI circuits are indispensable for modern electronic devices, and numerous hardware/softw...
Power dissipation has become a significant concern in deep submicron VLSI and a substantial amount o...
International audiencePower dissipation has become a major design objective in many application area...
Low-power VLSI circuits are indispensable for almost all types of modern electronic devices, from ba...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
International audienceTest power relates to the power consumed during test of integrated circuits or...
Power dissipation is a challenging problem in current VLSI designs. In general the power consumption...
Power consumption has become the most important issue in the design of integrated circuits. The powe...
This paper first reviews the basics of VLSI testing, focusing on test generation and design for test...
AbstractOver the past decade VLSI manufacturing industry flourishing very rapidly. Now a days hundre...
A generic built-in self-test needed for SoC devices implementing for low power consumption. In this ...
Testing low power very large scale integrated (VLSI) circuits has recently become an area of concern...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN040606 / BLDSC - British Library D...
Power minimization and test length reduction are two objectives for BIST (Built-In-Self-Test). To re...
circuit were proposed. It eliminates the peak power consumption problem of conventional shift-based ...
Low-power VLSI circuits are indispensable for modern electronic devices, and numerous hardware/softw...
Power dissipation has become a significant concern in deep submicron VLSI and a substantial amount o...
International audiencePower dissipation has become a major design objective in many application area...
Low-power VLSI circuits are indispensable for almost all types of modern electronic devices, from ba...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
International audienceTest power relates to the power consumed during test of integrated circuits or...
Power dissipation is a challenging problem in current VLSI designs. In general the power consumption...
Power consumption has become the most important issue in the design of integrated circuits. The powe...
This paper first reviews the basics of VLSI testing, focusing on test generation and design for test...
AbstractOver the past decade VLSI manufacturing industry flourishing very rapidly. Now a days hundre...
A generic built-in self-test needed for SoC devices implementing for low power consumption. In this ...
Testing low power very large scale integrated (VLSI) circuits has recently become an area of concern...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN040606 / BLDSC - British Library D...
Power minimization and test length reduction are two objectives for BIST (Built-In-Self-Test). To re...
circuit were proposed. It eliminates the peak power consumption problem of conventional shift-based ...