Total ionizing dose (TID), heavy ion and proton characterization have previously been performed on Virtex FPGAs, fabricated on epitaxial silicon, to evaluate the on-orbit radiation performance expected for this technology. The dominant risk is Single Event Upset (SEU), so upset detection and mitigation schemes were developed and tested to demonstrate the improvement in the programmed functional upset sensitivity and the system consequence of upsets. The Xilinx prescribed SEU mitigation schemes were tested for a generic functional usage at the proton facility in UC Davis
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
Abstract portability and reuse by providing consistent and Heavy ion testing of the Xilinx Virtex II...
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an i...
This slide presentation reviews the single event upset static testing of the Virtex II field program...
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Dif...
The performance, in-system reprogrammability, flexibility, and reduced costs of SRAM-based field-pro...
This paper discusses the application of Space Micro‘s Time-Triple Modular Redundancy (TTMR™) and Har...
The Xilinx Virtex-II Pro is a platform FPGA that embeds multiple microprocessors within the fabric o...
Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xi...
This paper presents the latest single event effects (SEE) test results of the Xilinx soft error miti...
Several VLSI devices that are not radiation hardened are still being used in spacecraft systems. The...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
The radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing do...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
Abstract portability and reuse by providing consistent and Heavy ion testing of the Xilinx Virtex II...
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an i...
This slide presentation reviews the single event upset static testing of the Virtex II field program...
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Dif...
The performance, in-system reprogrammability, flexibility, and reduced costs of SRAM-based field-pro...
This paper discusses the application of Space Micro‘s Time-Triple Modular Redundancy (TTMR™) and Har...
The Xilinx Virtex-II Pro is a platform FPGA that embeds multiple microprocessors within the fabric o...
Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xi...
This paper presents the latest single event effects (SEE) test results of the Xilinx soft error miti...
Several VLSI devices that are not radiation hardened are still being used in spacecraft systems. The...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
The radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing do...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
Abstract portability and reuse by providing consistent and Heavy ion testing of the Xilinx Virtex II...
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an i...