Temperature-induced reliability issues are among the major chal-lenges for multicore architectures. Thermal hot spots and ther-mal cycles combine to degrade reliability. This research presents new reliability-aware job scheduling and power management ap-proaches for chip multiprocessors. Accurate evaluation of these policies requires a novel simulation framework that can capture architecture-level effects over tens of seconds or longer, while also capturing thermal interactions among cores resulting from dynamic scheduling policies. Using this framework and a set of new thermal management policies, this work shows that techniques that offer similar performance, energy, and even peak temperature can differ signicantly in their effects on the...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
With continuous IC(Integrated Circuit) technology size scaling, more and more transistors are integr...
High temperatures and large thermal variations on the die create severe challenges in system reliabi...
Abstract: The increased complexity and operating frequency in current microprocessors is resulting i...
The use of high-end multicore processors today can incur high power density with significant variabi...
The use of high-end multicore processors today can incur high power density with significant variabi...
Multi-core computer systems have widely been accepted as the future standard in computer architectur...
The use of high-end multicore processors today can incur high power density with significant variabi...
Power and thermal issues are primary design constraints in both stationary and portable computing de...
Power and thermal issues are primary design constraints in both stationary and portable computing de...
Abstract—Multi-core System-on-Chip (SoC) has become a popular execution platform for many embedded r...
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, tim...
In modern CMOS integrated Systems-on-Chip global temperature variations arise as well as local fluct...
Reliability has become a significant challenge for system design in new process technologies. Higher...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
With continuous IC(Integrated Circuit) technology size scaling, more and more transistors are integr...
High temperatures and large thermal variations on the die create severe challenges in system reliabi...
Abstract: The increased complexity and operating frequency in current microprocessors is resulting i...
The use of high-end multicore processors today can incur high power density with significant variabi...
The use of high-end multicore processors today can incur high power density with significant variabi...
Multi-core computer systems have widely been accepted as the future standard in computer architectur...
The use of high-end multicore processors today can incur high power density with significant variabi...
Power and thermal issues are primary design constraints in both stationary and portable computing de...
Power and thermal issues are primary design constraints in both stationary and portable computing de...
Abstract—Multi-core System-on-Chip (SoC) has become a popular execution platform for many embedded r...
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, tim...
In modern CMOS integrated Systems-on-Chip global temperature variations arise as well as local fluct...
Reliability has become a significant challenge for system design in new process technologies. Higher...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
With continuous IC(Integrated Circuit) technology size scaling, more and more transistors are integr...