Abstract—The frequency of hardware errors is increasing due to shrinking feature sizes, higher levels of integration, and increasing design complexity. Intermittent errors are those that occur non-deterministically at the same location. It has been shown that intermittent hardware errors contribute to about 39 % of the total hardware failures. Intermittent faults have characteristics that are different than transient and permanent errors, which makes it challenging to devise efficient recovery techniques for them. In this paper, we evaluate the impact of different intermittent error recovery scenarios on the processor performance. To achieve this, we model a system that consists of a fault-tolerant multicore processor subject to intermitten...
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and v...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Over three decades of continuous scaling in CMOS technology has led to tremendous improvements in pr...
Abstract—Intermittent hardware faults are bursts of errors that last from a few CPU cycles to a few ...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Future multicore processors will become more susceptible to a variety of hardware failures. In parti...
Past years have seen intense research on reliability techniques for error detection recovery at vari...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
As semiconductor technology scales into the nanometer regime, intermittent faults have become an inc...
Continuous scaling of transistor feature size rapidly increases the effect of intermittent faults. T...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
Traditional reliability-related models for fault-tolerant systems are used to predict system reliabi...
Abstract—Intermittent hardware faults are hard to diagnose as they occur non-deterministically at th...
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and v...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Over three decades of continuous scaling in CMOS technology has led to tremendous improvements in pr...
Abstract—Intermittent hardware faults are bursts of errors that last from a few CPU cycles to a few ...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Future multicore processors will become more susceptible to a variety of hardware failures. In parti...
Past years have seen intense research on reliability techniques for error detection recovery at vari...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
As semiconductor technology scales into the nanometer regime, intermittent faults have become an inc...
Continuous scaling of transistor feature size rapidly increases the effect of intermittent faults. T...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
Traditional reliability-related models for fault-tolerant systems are used to predict system reliabi...
Abstract—Intermittent hardware faults are hard to diagnose as they occur non-deterministically at th...
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and v...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...