Add to ORKGThis paper discusses the gate-level automatic test pattern generation (ATPG) methods and techniques for sequential circuits. The basic concepts, examples, advantages, and limitations of representative methods are reviewed in detail. The relationship between gate-level sequen-tial circuit ATPG and the partial scan design is also discussed
Genetic Algorithms have been recently investigated as an efficient approach to test generation for s...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
A novel approach to testing sequential circuits that uses multi-level decision diagram representatio...
The traditional approaches to test generation made use of the gate level representation of the circu...
A new approach for sequential circuit test genera-tion is proposed that combines software testing ba...
A new approach for sequential circuit test generation is proposed that combines software testing bas...
This paper presents an efficient and novel method for sequential learning of implications, invalid s...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
I would like to thank the entire staff and my fellow students at the institute for creating a friend...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Identifying and understanding...
Some design environments may prevent Design for Testability techniques from reducing testing to a co...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
This paper presents a switch-level test generation system for synchronous sequential circuits in whi...
Automatic Test Pattern Generation (ATPG) is unavoidable for large combinational circuits, However,...
Automatic Test Pattern Generation (ATPG) is the process of generating tests vectors for a circuit gi...
Genetic Algorithms have been recently investigated as an efficient approach to test generation for s...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
A novel approach to testing sequential circuits that uses multi-level decision diagram representatio...
The traditional approaches to test generation made use of the gate level representation of the circu...
A new approach for sequential circuit test genera-tion is proposed that combines software testing ba...
A new approach for sequential circuit test generation is proposed that combines software testing bas...
This paper presents an efficient and novel method for sequential learning of implications, invalid s...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
I would like to thank the entire staff and my fellow students at the institute for creating a friend...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Identifying and understanding...
Some design environments may prevent Design for Testability techniques from reducing testing to a co...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
This paper presents a switch-level test generation system for synchronous sequential circuits in whi...
Automatic Test Pattern Generation (ATPG) is unavoidable for large combinational circuits, However,...
Automatic Test Pattern Generation (ATPG) is the process of generating tests vectors for a circuit gi...
Genetic Algorithms have been recently investigated as an efficient approach to test generation for s...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
A novel approach to testing sequential circuits that uses multi-level decision diagram representatio...