Abstract: On the market are available many data acquisition systems not specifically designed for measurement application. When used for this particular purpose, although the digital stage would be adequate, the analog front-end is often source of unacceptable uncertainty. A new opportunity offered by modern powerful digital processor hosted on data acquisition systems consist in employing the processor for identify and compensate the non-ideal behavior of the analog front-end in real-time. The effectiveness of this method is greatly conditioned by the accuracy that can be achieved in the identification of the analog stage transfer function. This paper aims to investigate the effect of uncertainty in the test signal generator used to produc...
Dynamic calibration of the pressure transducers and accelerometers are carried out by applying dynam...
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National I...
The accuracy of a true-RMS detector board based on the Analog Devices LTC5596 is determined by measu...
The type-B evaluation of the uncertainty affecting the measurements provided by any instrument could...
The paper deals with a test method, based on the generation of signals with known and pre-assigned h...
The usual accuracy specifications of voltage transducers cannot be used to determine the uncertainty...
Abstract: Estimation of the output expectation and standard uncertainty in indirect measurements bas...
Abstract—We describe a method for calibrating the voltage that a step-like pulse generator produces ...
In many engineering applications the phase angle of a signal is a key parameter. Especially when mea...
Estimation of the output expectation and standard uncertainty in indirect measurements based on digi...
The measurement of power quality is becoming an impelling need in a deregulated electricity market w...
The paper presents a procedure to improve the accuracy of a digital sampling oscilloscope in the acq...
The paper deals with two relevant aspects of output section characterization of an Arbitrary Wavefor...
The paper deals with the uncertainty in measurement based on digital signal processing algorithms, l...
The paper presents a type A (experimental) evaluation of the uncertainty due to systematic effects. ...
Dynamic calibration of the pressure transducers and accelerometers are carried out by applying dynam...
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National I...
The accuracy of a true-RMS detector board based on the Analog Devices LTC5596 is determined by measu...
The type-B evaluation of the uncertainty affecting the measurements provided by any instrument could...
The paper deals with a test method, based on the generation of signals with known and pre-assigned h...
The usual accuracy specifications of voltage transducers cannot be used to determine the uncertainty...
Abstract: Estimation of the output expectation and standard uncertainty in indirect measurements bas...
Abstract—We describe a method for calibrating the voltage that a step-like pulse generator produces ...
In many engineering applications the phase angle of a signal is a key parameter. Especially when mea...
Estimation of the output expectation and standard uncertainty in indirect measurements based on digi...
The measurement of power quality is becoming an impelling need in a deregulated electricity market w...
The paper presents a procedure to improve the accuracy of a digital sampling oscilloscope in the acq...
The paper deals with two relevant aspects of output section characterization of an Arbitrary Wavefor...
The paper deals with the uncertainty in measurement based on digital signal processing algorithms, l...
The paper presents a type A (experimental) evaluation of the uncertainty due to systematic effects. ...
Dynamic calibration of the pressure transducers and accelerometers are carried out by applying dynam...
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National I...
The accuracy of a true-RMS detector board based on the Analog Devices LTC5596 is determined by measu...