Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated

described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologies (150 nm through 40 nm) for their sensitivity to radiation-induced, single-event upsets and detailed the results from simulation, beam testing, and atmospheric testing. This white paper clarifies some open issues from the 2005 Xilinx Rosetta experiments and presents additional results for various technology nodes down to 40 nm