A System for the Micrometric Characterization of Solar Cells

Laser Beam Induced Current (LBIC) imaging is a nondestructive characterization technique which can be used for research into semiconductor and photovoltaic devices (Dimassi et al., 2008). Since its first application to p-n junction photodiode structures used in HgCdTe infrared focal plane arrays in the late 1980s, many experimental studies have demonstrate